Episode Details
Back to EpisodesHistory of VNAs Leading Up to 330 to 500 GHz Full Vector Component Test System
Episode 423
Published 7 months, 3 weeks ago
Description
Microwave Journal editors Pat Hindle and Del Pierson explore the history of VNAs and other testing technologies at Keysight Technologies that lead up to development of a full vector component testing system at 330 to 500 GHz shown at IMS this year by talking with Joel Dunsmore, Research Fellow at Keysight Technologies.